Observation of an Indenter with an Atomic Force Microscope Calibrated with Dual Standard References
-
Published:2015-08-01
Issue:4
Volume:10
Page:455-459
-
ISSN:1555-130X
-
Container-title:Journal of Nanoelectronics and Optoelectronics
-
language:en
-
Short-container-title:Journal of Nanoelectronics and Optoelectronics
Author:
Kim Yong-Il,Lee Yun-Hee,Kim Ki-Bok,Huh Yong-Hak
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials