3D Numerical Modeling and Extraction of Noise Parameters of Uniformly Doped Metal-Semiconductor Field Effect Transistor Photodetector
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Published:2009-03-01
Issue:3
Volume:6
Page:561-570
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ISSN:1546-1955
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Container-title:Journal of Computational and Theoretical Nanoscience
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language:en
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Short-container-title:Jnl of Comp & Theo Nano
Author:
Balasubadra K.,Rajamani V.,Sankaranarayanan K.
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering,Computational Mathematics,Condensed Matter Physics,General Materials Science,General Chemistry