Unified Compact Modeling of a Gate Tunneling Current Considering Image Force Induced Barrier Lowering for a Nanoscale N-MOSFET
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Published:2007-05-01
Issue:3
Volume:4
Page:482-487
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ISSN:1546-1955
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Container-title:Journal of Computational and Theoretical Nanoscience
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language:en
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Short-container-title:Jnl of Comp & Theo Nano
Author:
Kumar Ashwani,Dasgupta S.
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering,Computational Mathematics,Condensed Matter Physics,General Materials Science,General Chemistry