Affiliation:
1. Department of Electronic and Electrical Engineering, Hongik University, Seoul 04066, Republic of Korea
2. Department of Electronic Engineering, Hallym University, Chuncheon 24252, Republic of Korea
Abstract
We investigate the electrical characteristics of solution-processed poly(3-hexylthiophene-2,5-diyl) (P3HT) thin-film transistors (TFTs) under monochromatic illumination conditions at different wavelengths of 700, 655, 515, and 315 nm. The TFT characteristics measured under light illumination
at the wavelengths of 700 and 655 nm were comparable to those measured in the dark state. In addition, light illumination at a wavelength of 515 nm, of which photon energy (~2.4 eV) is higher than the band gap energy of P3HT (~1.7 eV), had a little effect on the electrical characteristics
of P3HT TFTs. On the other hand, the TFT performance was notably changed by light illumination at a wavelength of 315 nm. These results indicate that the photon energy, which cause the characteristic degradation in the solution-processed P3HT TFTs, is much higher than the band gap energy of
P3HT. Consequently, the illumination-induced variation in the TFT performance can be understood through a broad distribution of energetic states in the solution-processed P3HT semiconductor.
Publisher
American Scientific Publishers
Subject
Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering
Cited by
2 articles.
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