Breakdown Characteristics of High-Side Lateral Double-Diffused Metal Oxide Semiconductor Devices
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Published:2012-07-01
Issue:7
Volume:12
Page:5297-5302
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ISSN:1533-4880
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Container-title:Journal of Nanoscience and Nanotechnology
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language:en
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Short-container-title:j nanosci nanotechnol
Author:
Sung Kunsik,Kim Kwangsik,Won Taeyoung
Publisher
American Scientific Publishers
Subject
Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering