Thickness-Dependent Resistive Switching Behavior of KCu7S4/CuxO/Au Device
Author:
Affiliation:
1. School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei, Anhui 230009, P. R. China
2. School of Automotive and Transport Engineering, Hefei University of Technology, Hefei, Anhui 230009, P. R. China
Publisher
American Scientific Publishers
Subject
Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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