Development of 2000 K Class High Temperature In Situ Transmission Electron Microscopy of Nanostructured Materials via Resistive Heating-Reference-Cited by-同舟云学术

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Development of 2000 K Class High Temperature In Situ Transmission Electron Microscopy of Nanostructured Materials via Resistive Heating

Published:2017-04-01 Issue:4 Volume:17 Page:2848-2851
ISSN:1533-4880
Container-title:Journal of Nanoscience and Nanotechnology
language:en
Short-container-title:j nanosci nanotechnol

Author:

Terasawa Tomo-o¹,Kikuchi Shogo¹,Tezura Manabu¹,Kizuka Tokushi¹

Affiliation:

1. Division of Materials Science, Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan

Publisher

American Scientific Publishers

Subject

Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. In situ high-temperature transmission electron microscopy of tantalum/carbon composite films under near-infrared laser irradiation;Diamond and Related Materials;2024-10

2. 材料力学性能原位测试技术：发展与应用;Laser & Optoelectronics Progress;2023

3. High-power laser irradiation for high-temperature in situ transmission electron microscopy;Micron;2022-06

4. In situ transmission electron microscopy of high-temperature degradation of yttria-stabilized zirconia thermal barrier coatings;Scripta Materialia;2018-06

5. Surface Morphology Analysis of Zirconium Dioxide Nanoparticles at 1200 K by Transmission Electron Microscopy;Journal of Nanoscience and Nanotechnology;2018-01-01

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