Investigation of Hot-Carrier Reliability in Junctionless Polysilicon Thin-Film Transistors
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Published:2017-05-01
Issue:5
Volume:17
Page:3375-3377
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ISSN:1533-4880
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Container-title:Journal of Nanoscience and Nanotechnology
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language:en
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Short-container-title:j nanosci nanotechnol
Author:
Lee Hojoon1,
Lee Junyoung1,
Oh Hyeongwan1,
Kim Jiwon1,
Lee Jeong-Soo1
Affiliation:
1. Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, 37673, Korea
Publisher
American Scientific Publishers
Subject
Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering