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Deep Understanding of Retention Characteristics in Various Conditions in Sub 20-nm NAND Flash Memory

  • Published:2017-05-01 Issue:5 Volume:17 Page:3155-3159
  • ISSN:1533-4880
  • Container-title:Journal of Nanoscience and Nanotechnology
  • language:en
  • Short-container-title:j nanosci nanotechnol

Author:

Lee Kyunghwan1,Kang Myounggon2,Shin Hyungcheol1

Affiliation:

1. Department of Electrical and Computer Engineering, Seoul National University, 1 Gwanak-ro, Gwanak-gu, Seoul 151-744, Republic of Korea

2. Department of Electronics Engineering, Korea National University of Transportation, 2 Daehak-ro, Chungju-City, Chungbuk, 380-702, Republic of Korea

Publisher

American Scientific Publishers

Subject

Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering
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