The Evaluation of Hole Mobility Characteristics with Surface Roughness
Author:
Affiliation:
1. Department of Nano-Medical Devices Engineering, Hallym University, Chuncheon, Gangwon-do, 24252, Korea
2. Nanophotonics Research Center, Korea Institute of Science and Technology, Seoul, 02792, Korea
Publisher
American Scientific Publishers
Subject
Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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3. Hole Mobility Characteristics with Surface Roughness on Silicon-on-Insulator Substrate;Journal of Nanoscience and Nanotechnology;2018-09-01
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