Author:
Aditya Lakshmikanta,Srivastava A.,Sahoo S. K.,Das P.,Mukherjee C.,Misra Abha,Reddy V. R.,Shinde R. S.,Gupta Ajay,Prasad Shiva,Samajdar I.,Nandedkar R. V.,Venkataramani N.
Abstract
Cobalt ferrite thin films have been deposited on fused quartz substrates by pulsed laser deposition at various substrate temperatures, TS (25 °C, 300 °C, 550 °C and 750 °C). Single phase, nanocrystalline, spinel cobalt ferrite formation is confirmed
by X-ray diffraction (XRD) for TS ≥ 300 °C. Conventional XRD studies reveal strong (111) texturing in the as deposited films with TS ≥ 550 °C. Bulk texture measurements using X-ray orientation distribution function confirmed (111) preferred
orientation in the films with TS ≥ 550 °C. Grain size (13–16 nm for TS ≥ 300 °C) estimation using grazing incidence X-ray line broadening analysis shows insignificant grain growth with increasing TS, which is in good
agreement with grain size data obtained from transmission electron microscopy.
Publisher
American Scientific Publishers
Subject
Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering
Cited by
5 articles.
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