Hardness Study of Carbon Nanotube and Silicon Transistors Under the High Energy Electron Beam Radiation Effect
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Published:2018-01-01
Issue:1
Volume:13
Page:125-131
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ISSN:1555-130X
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Container-title:Journal of Nanoelectronics and Optoelectronics
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language:en
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Short-container-title:Journal of Nanoelectronics and Optoelectronics
Author:
Toroghi Soheil Mahdian,Ahmadi M. T.,Golzan M. M.,Mahdian Rahil
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials