Affiliation:
1. The Xinjiang Technical Institute of Physics & Chemistry, Chinese Academy of Sciences, Urumqi, 830011, China
Abstract
The experiments of total ionizing dose radiation effects on color CMOS image sensors at different biases were presented. Two bias conditions operated during 60Co γ irradiation, biased and unbiased. In the data processing, the data of four channels were extracted
according to the sequence of Bayer array respectively to study the difference between each channel. The full well capacity and dark signal non-uniformity versus the cumulative doses were investigated. After γ-ray irradiation, the full well capacity of the samples decreased along with
dark signal non-uniformity increased. Meanwhile, the descending amplitude of full well capacity was different in each channel, but the variation of dark signal non-uniformity was almost consistent. Moreover, the degradations of full well capacity and dark signal non-uniformity were more seriously
under-biased.
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献