Influence of in volatilization on photoluminescence in InGaN/GaN multiple quantum wells

Abstract

Two multiple quantum well (MQW) InGaN/GaN structures emitting green light, without (A) and with (B) an indium (In) volatilization suppression technique (IVST) during growth of the active region, were fabricated. The dependencies of the photoluminescence (PL) spectra upon temperature at different levels of excitation power were investigated. The results indicate that an IVST can increase the In content while suppressing the phase separation caused by volatilization of that In incorporated in the well layers. Also, compared with Structure B with IVST, which contains one phase structure, Structure A without IVST, which contains two separate phases (i.e., an In-rich phase and an In-poor phase), exhibits higher internal quantum efficiency (IQE) at low excitation power and lower IQE at high excitation power. The former is mainly attributed to the stronger In-rich phase-related localization effect of Structure A, because the In-rich phase-related emission dominates the PL spectra of Structure A at a low excitation power; the latter is mainly due to the In-poor phase-related weaker localization effect of Structure A, because the In-poor phase-related emission dominates the PL spectra of Structure A at high excitation power because localized states in this In-rich phase are saturated.