The Measurement of Electric Field Distribution in the Barrier Structures Based on Disordered Semiconductors
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Published:2015-03-01
Issue:6
Volume:9
Page:773-777
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ISSN:1555-130X
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Container-title:Journal of Nanoelectronics and Optoelectronics
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language:en
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Short-container-title:Journal of Nanoelectronics and Optoelectronics
Author:
Vishnyakov N. V.,Vikhrov S. P.,Mishustin V. G.,Almazov D. V.,Litvinov V. G.,Gudzev V. V.
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials