Optical Study of Mn-Doped Bi4Ti3O12 Thin Films by Spectroscopic Ellipsometry-Reference-Cited by-同舟云学术

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Optical Study of Mn-Doped Bi4Ti3O12 Thin Films by Spectroscopic Ellipsometry

Published:2011-01-01 Issue:1 Volume:11 Page:884-888
ISSN:1533-4880
Container-title:Journal of Nanoscience and Nanotechnology
language:en
Short-container-title:j nanosci nanotechnol

Author:

Hwang Soon Yong,Kim Tae Jung,Yoon Jae Jin,Cha Young Hun,Kim Young Dong,Seong Tae-Geun,Kang Lee-Seung,Nahm Sahn

Publisher

American Scientific Publishers

Subject

Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optical study of Ba(Mn x Ti( 1− x )O 3 ) thin films by spectroscopic ellipsometry;Chinese Physics B;2013-11

2. Effect of different sputtering gas mixtures on the structural, electrical, and optical properties of p-type NiO thin films;Materials Science in Semiconductor Processing;2013-10

3. Reversibility of Electrowetting on Hydrophobic Surfaces and Dielectrics Under Continuous Applied DC Voltage;Journal of Nanoscience and Nanotechnology;2011-08-01

4. Investigation of the Crystallization of Amorphous Si by Imaging Ellipsometry;Journal of Nanoscience and Nanotechnology;2011-07-01

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