Electrical Characterization of n/p-Type Nickel Silicide/Silicon Junctions by Sb Segregation
-
Published:2011-08-01
Issue:8
Volume:11
Page:7339-7342
-
ISSN:1533-4880
-
Container-title:Journal of Nanoscience and Nanotechnology
-
language:en
-
Short-container-title:J. Nanosci. Nanotech.
Author:
Jun Myungsim,Park Youngsam,Hyun Younghoon,Choi Sung-Jin,Zyung Taehyung,Jang Moongyu
Publisher
American Scientific Publishers
Subject
Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering