Edge Termination for Optimized Silicon Carbide MOSFET Breakdown Voltage
-
Published:2016-10-01
Issue:5
Volume:11
Page:585-588
-
ISSN:1555-130X
-
Container-title:Journal of Nanoelectronics and Optoelectronics
-
language:en
-
Short-container-title:Journal of Nanoelectronics and Optoelectronics
Author:
Woo Sola,Geum Jongmin,Kyoung Sinsu,Sung Man Yung
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials