Effect of an Electron Beam Treatment of the ZTO Active Layer on the Characteristics of Solution-Processed Thin-Film Transistors
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Published:2016-02-01
Issue:1
Volume:11
Page:51-55
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ISSN:1555-130X
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Container-title:Journal of Nanoelectronics and Optoelectronics
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language:en
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Short-container-title:Journal of Nanoelectronics and Optoelectronics
Author:
Song Jae-Min,Bae Byung Seong,Yun Eui-Jung
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials