Enhancing the Static Noise Margins by Upsizing Length for Ultra-Low Voltage/Power/Energy Gates
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Published:2014-03-01
Issue:1
Volume:10
Page:137-148
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ISSN:1546-1998
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Container-title:Journal of Low Power Electronics
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language:en
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Short-container-title:Journal of Low Power Electronics
Author:
Tache Mihai,Beiu Valeriu,Ibrahim Walid,Kharbash Fekri,Alioto Massimo
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering