Ensuring Power-Safe Application of Test Patterns Using an Effective Gating Approach Considering Current Limits
-
Published:2012-04-01
Issue:2
Volume:8
Page:235-247
-
ISSN:1546-1998
-
Container-title:Journal of Low Power Electronics
-
language:en
-
Short-container-title:Journal of Low Power Electronics
Author:
Zhao Wei,Tehranipoor Mohammad,Chakravarty Sreejit
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering