Magnetic Tunnel Junction Reliability Assessment Under Process Variations and Activity Factors and Mitigation Techniques
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Published:2018-06-01
Issue:2
Volume:14
Page:217-226
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ISSN:1546-1998
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Container-title:Journal of Low Power Electronics
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language:en
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Short-container-title:Journal of Low Power Electronics
Author:
Iyengar Anirudh S.,Ghosh Swaroop,Rathi Nitin
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering
Cited by
1 articles.
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