Effects of Lightly Doped Drain and Channel Doping Variations on Flash Memory Performances and Reliability
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Published:2012-12-01
Issue:5
Volume:8
Page:717-724
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ISSN:1546-1998
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Container-title:Journal of Low Power Electronics
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language:en
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Short-container-title:Journal of Low Power Electronics
Author:
Just Guillaume,Marca Vincenzo Della,Régnier Arnaud,Ogier Jean-Luc,Postel-Pellerin Jérémy,Portal Jean-Michel,Masson Pascal
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering