Surface characterization of as-grown CeO<SUB>2</SUB> cap layer morphology evolution and critical current density of post-deposited YBCO films-Reference-Cited by-同舟云学术

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Surface characterization of as-grown CeO₂ cap layer morphology evolution and critical current density of post-deposited YBCO films

Published:2015-12-01 Issue:6 Volume:5 Page:534-540
ISSN:2158-5849
Container-title:Materials Express
language:en
Short-container-title:Mat Express

Author:

Feng Feng,Zhang Yanyi,Qu Timing,Huang Rongxia,Xiao Shaozhu,Zhu Yuping,Lu Hongyuan,Shi Kai,Hou Zongfang,Han Zhenghe

Publisher

American Scientific Publishers

Subject

General Materials Science

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Polymer-assisted chemical solution deposition of high-quality La2Zr2O7 buffer layer applied to low-cost YBCO-coated conductors;Journal of Materials Science: Materials in Electronics;2020-02-27

2. Critical current survival in the YBCO superconducting layer of a delaminated coated conductor;Superconductor Science and Technology;2018-02-26

3. Epitaxial growth of CaTiO3 buffer layer for fabrication of c-axis oriented YBCO film by sol-gel method;Journal of Sol-Gel Science and Technology;2016-12-15

4. A Method to Fabricate Biaxially Textured MgO Buffer Layer for HTS Coated Conductor;IEEE Transactions on Applied Superconductivity;2016-04

5. Thermodynamics and Kinetics Analysis of MOD-YBCO Heat Treatment Process Using in situ Resistance Measurement Method;IEEE Transactions on Applied Superconductivity;2016-04

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