Characterisation of a Cr(VI) Sensitive Polysiloxane Membrane by X-ray Photoelectron Spectrometry and Atomic Force Microscopy-Reference-Cited by-同舟云学术

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Characterisation of a Cr(VI) Sensitive Polysiloxane Membrane by X-ray Photoelectron Spectrometry and Atomic Force Microscopy

Published:2009-10-01 Issue:5 Volume:7 Page:995-1000
ISSN:1546-198X
Container-title:Sensor Letters
language:en
Short-container-title:sens lett

Author:

Zazoua A.,Kherrat R.,Caballero D.,Errachid A.,Jaffrezic-Renault N.,Bessueille F.,Léonard D.

Publisher

American Scientific Publishers

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Multivariate processing of atomic-force microscopy images for detection of the response of plasticized polymeric membranes;Russian Journal of Applied Chemistry;2014-03

3. Cadmium-sensitive electrode based on tetracetone derivatives of p-tert-butylcalix[8]arene;Materials Science and Engineering: C;2013-10

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