Establishment and Analysis of Tapping Mode Atomic Force Microscopy Simulative Measurement Model Affected by External Environment Vibration
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Published:2013-11-01
Issue:11
Volume:10
Page:2676-2693
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ISSN:1546-1955
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Container-title:Journal of Computational and Theoretical Nanoscience
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language:en
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Short-container-title:Jnl of Comp & Theo Nano
Author:
Lin Zone-Ching,Chou Ming-Ho
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering,Computational Mathematics,Condensed Matter Physics,General Materials Science,General Chemistry