A Study of Dielectric Reliability of Anodic TiO2 Based Single and Double Layer Metal-Insulator-Metal Capacitors
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Published:2017-01-01
Issue:1
Volume:12
Page:85-88
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ISSN:1555-130X
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Container-title:Journal of Nanoelectronics and Optoelectronics
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language:en
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Short-container-title:Journal of Nanoelectronics and Optoelectronics
Author:
Karthik R.,Tummala Vijetha,Singh Vikram
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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