Advanced Magnetic Force Microscopy for High Resolution Magnetic Imaging-Reference-Cited by-同舟云学术

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Advanced Magnetic Force Microscopy for High Resolution Magnetic Imaging

Published:2012-06-01 Issue:6 Volume:4 Page:628-633
ISSN:1941-4900
Container-title:Nanoscience and Nanotechnology Letters
language:en
Short-container-title:Nanosci Nanotechnol Lett

Author:

Ranjbar M.,Piramanayagam S. N.,Sbiaa R.,Chong T. C.,Okamoto I.

Publisher

American Scientific Publishers

Subject

General Materials Science

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Room temperature exchange bias in antiferromagnetic composite BiFeO3-TbMnO3;Journal of Applied Physics;2019-12-28

2. Higher Resolution Scanning Probe Methods for Magnetic Imaging;Surface Science Tools for Nanomaterials Characterization;2015

3. Applications of Scanning Probe-Atomic Force Microscopy in Nanobioelectronics;Journal of Nanoscience and Nanotechnology;2014-01-01

4. The Role of Functionalized Magnetic Iron Oxide Nanoparticles in the Central Nervous System Injury and Repair: New Potentials for Neuroprotection with Cerebrolysin Therapy;Journal of Nanoscience and Nanotechnology;2014-01-01

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