Reliability Degeneration Mechanisms of the 20-nm Flash Memories Due to the Word Line Stress
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Published:2016-02-01
Issue:2
Volume:16
Page:1669-1671
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ISSN:1533-4880
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Container-title:Journal of Nanoscience and Nanotechnology
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language:en
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Short-container-title:j nanosci nanotechnol
Author:
Jung Hyun Soo,Ryu Ju Tae,Yoo Keon-Ho,Kim T.W.
Publisher
American Scientific Publishers
Subject
Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering