Electrical Characterization and Surface Topography of SiC Nanoparticle/CNTs Embedded 4H–SiC MOS Structure
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Published:2016-11-01
Issue:11
Volume:16
Page:11413-11416
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ISSN:1533-4880
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Container-title:Journal of Nanoscience and Nanotechnology
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language:en
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Short-container-title:j nanosci nanotechnol
Author:
Jeong Young-Seok1,
Kang Min-Seok1,
Koo Sang-Mo1
Affiliation:
1. Department of Electronic Materials Engineering, Kwangwoon University, Seoul 139-701, Korea
Publisher
American Scientific Publishers
Subject
Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering