Exploration of Inter-Die Bulk Fin-Typed Field Effect Transistor Process Variation for Reduction of Device Variability
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Published:2016-06-01
Issue:6
Volume:16
Page:6124-6130
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ISSN:1533-4880
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Container-title:Journal of Nanoscience and Nanotechnology
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language:en
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Short-container-title:j nanosci nanotechnol
Affiliation:
1. Parallel and Scientific Computing Laboratory, National Chiao Tung University, Hsinchu 300, Taiwan
Publisher
American Scientific Publishers
Subject
Condensed Matter Physics,General Materials Science,Biomedical Engineering,General Chemistry,Bioengineering