Analysis on the Temperature-Dependence of the Flow Stress in Metallic Thin Films Based on an Exponential Decay Model
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Published:2014-10-01
Issue:10
Volume:20
Page:2278-2281
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ISSN:1936-6612
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Container-title:Advanced Science Letters
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language:en
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Short-container-title:adv sci lett
Author:
Duryat Rahmat Saptono,Kim Choong-Un
Publisher
American Scientific Publishers
Subject
General Energy,General Engineering,General Environmental Science,Education,General Mathematics,Health (social science),General Computer Science