Investigation of Albedo Factor Parameters in Some Selected Sn Compounds

Abstract

In recent years, studies on the elements used in producing electronic device components and the interaction of their different compounds with radiation have been emphasized. In developing this situation, giving importance to space studies and different searches in energy production have been very effective. In the light of these developments, the interaction of tin, which is widely used in the production of electronic device components and different industrial areas, with radiation has been investigated. For this purpose, the variation of albedo factor values in some compounds of the tin element was investigated and presented. Am-241 radioactive sources were used as incident radiation in determining the albedo factor values mentioned in the study. The albedo factor values obtained by examining the Compton and coherent scattering peaks were used to determine the albedo factor values.