Author:
Hamdioui Said,Al-Ars Zaid,van de Goor Ad J.,Rodgers Mike
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Cited by
28 articles.
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1. SRAM Memory Testing Methods and Analysis;Advances in Systems Analysis, Software Engineering, and High Performance Computing;2023-12-18
2. On Using Cell-Aware Methodology for SRAM Bit Cell Testing;2023 IEEE European Test Symposium (ETS);2023-05-22
3. A New Fail Address Memory Architecture for Cost-Effective ATE;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023
4. Generation of New Low-Complexity March Algorithms for Optimum Faults Detection in SRAM;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022
5. March test algorithm for unlinked static reduced three-cell coupling faults in random-access memories;Microelectronics Journal;2019-11