Contributions of the environmental scanning electron microscope and X-ray diffraction in investigating the structural evolution of a SiO2aggregate attacked by alkali-silica reaction-Reference-Cited by-同舟云学术

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Contributions of the environmental scanning electron microscope and X-ray diffraction in investigating the structural evolution of a SiO2aggregate attacked by alkali-silica reaction

Published:2004-10 Issue:20 Volume:39 Page:6221-6226
ISSN:0022-2461
Container-title:Journal of Materials Science
language:en
Short-container-title:Journal of Materials Science

Author:

Verstraete J.,Khouchaf L.,Tuilier M. H.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Study of the Microstructure of Amorphous Silica Nanostructures Using High-Resolution Electron Microscopy, Electron Energy Loss Spectroscopy, X-ray Powder Diffraction, and Electron Pair Distribution Function;Materials;2020-10-01

2. A rapid analytical method for the specific surface area of amorphous sio2 based on X-Ray diffraction;Journal of Non-Crystalline Solids;2020-03

3. Fundamentals of alkali-silica gel formation and swelling: Condensation under influence of dissolved salts;Cement and Concrete Research;2018-03

4. Geochemistry and mineralogy of a complex sedimentary deposit in the alkaline volcanic Lake Specchio di Venere (Pantelleria Island, south Mediterranean);Journal of Limnology;2018-01-04

5. Study of structural short order and surface changes of SiO2 compounds;MATEC Web of Conferences;2018

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