Testability Trade-Offs for BIST Data Paths
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Published:2004-04
Issue:2
Volume:20
Page:169-179
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ISSN:0923-8174
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Container-title:Journal of Electronic Testing
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language:en
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Short-container-title:Journal of Electronic Testing
Author:
Nicolici Nicola,Al-Hashimi Bashir M.
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering