Mapping quantitative trait loci for flag leaf senescence as a yield determinant in winter wheat under optimal and drought-stressed environments-Reference-Cited by-同舟云学术

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Mapping quantitative trait loci for flag leaf senescence as a yield determinant in winter wheat under optimal and drought-stressed environments

Published:2004 Issue:3 Volume:135 Page:255-263
ISSN:0014-2336
Container-title:Euphytica
language:en
Short-container-title:Euphytica

Author:

Verma V.,Foulkes M.J.,Worland A.J.,Sylvester-Bradley R.,Caligari P.D.S.,Snape J.W.

Publisher

Springer Science and Business Media LLC

Subject

Horticulture,Plant Science,Genetics,Agronomy and Crop Science

Cited by 212 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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