10.1023/a:1008318002846
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. An Accumulator—Based Test-Per-Clock Scheme;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2011-06
2. A Low-Cost Accumulator-Based Test Pattern Generation Architecture;2008 14th IEEE International On-Line Testing Symposium;2008-07
3. Self-Testing Embedded Borden t-UED Code Checkers for t = 2 k q − 1 with q = 2 m − 1;Journal of Electronic Testing;2008-06-26
4. Design of Embedded m-out-of-n Code Checkers Using Complete Parallel Counters;13th IEEE International On-Line Testing Symposium (IOLTS 2007);2007-07
5. Single- and Double-Output Embedded Checker Architectures for Systematic Unordered Codes∗;Journal of Electronic Testing;2005-08
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