Author:
Ber B. Ya.,Kazantsev D. Yu.,Kalinina E. V.,Kovarskii A. P.,Kossov V. G.,Hallen A.,Yafaev R. R.
Publisher
Springer Science and Business Media LLC
Cited by
2 articles.
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1. Secondary Ion Mass Spectrometry (SIMS);Analytical Methods and Instruments for Micro- and Nanomaterials;2023
2. Current literature in mass spectrometry;Journal of Mass Spectrometry;2005