Effect of heat-treatment on LaNiO3film electrode of PZT thin films derived by a sol

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Effect of heat-treatment on LaNiO3film electrode of PZT thin films derived by a sol–gel method

Published:2004-11 Issue:11 Volume:15 Page:739-742
ISSN:0957-4522
Container-title:Journal of Materials Science: Materials in Electronics
language:en
Short-container-title:Journal of Materials Science: Materials in Electronics

Author:

Lu Wei,Zheng Ping,Du Wenjuan,Meng Zhongyan

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Formation of PZT Structures on Silicon;Bulletin of the Russian Academy of Sciences: Physics;2018-03

2. Preparation of a finely patterned LaNiO3 film via chemical modification;Journal of Materials Science: Materials in Electronics;2016-02-10

3. Optimization of structural, surface and electrical properties of solution processed LaNiO3 conducting oxide;Journal of Materials Science: Materials in Electronics;2015-01-24

4. Surface structure and electrical properties of solution processed lanthanum nickelate films;AIP Conference Proceedings;2014

5. Microstructure and electrical properties of LaNiO3 thin films by RF sputtering for the growth of (Pb,La)(Zr,Ti)O3 films on silicon and nickel substrates;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2012-11

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