Author:
Inoue Michiko,Gizdarski Emil,Fujiwara Hideo
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Cited by
2 articles.
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1. Combinational automatic test pattern generation for acyclic sequential circuits;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2005-06
2. An extended class of sequential circuits with combinational test generation complexity;Proceedings. IEEE International Conference on Computer Design: VLSI in Computers and Processors