Precision Interferometric Thickness Profiling of a Transparent Plate Using a Phase-Extraction Algorithm Suppressing Refractive-Index Dispersion
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Published:2022-05-31
Issue:5
Volume:46
Page:435-443
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ISSN:1226-4873
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Container-title:Transactions of the Korean Society of Mechanical Engineers - A
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language:en
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Short-container-title:KSME-A
Author:
Jeon Jurim,Kim Sungtae,Kim Yangjin
Publisher
The Korean Society of Mechanical Engineers
Subject
Mechanical Engineering