THE STUDY OF GROWTH DEFECTS IN CUBIC SINGLE CRYSTALS OF SYNTHETIC DIAMOND USING X-RAY TOPO-TOMOGRAPHY-Reference-Cited by-同舟云学术

THE STUDY OF GROWTH DEFECTS IN CUBIC SINGLE CRYSTALS OF SYNTHETIC DIAMOND USING X-RAY TOPO-TOMOGRAPHY

Published:2023-07-01 Issue:4 Volume:68 Page:507-513
ISSN:0023-4761
Container-title:Кристаллография
language:
Short-container-title:Kristallografiâ

Author:

Anisimov N. P.¹²,Zolotov D. A.¹,Buzmakov A. V.¹,Dyachkova I. G.¹,Asadchikov V. E.³

Affiliation:

1. Shubnikov Institute of Crystallography, Federal Research Center “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

2. Moscow State University, Moscow, 119234 Russia

3. Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Abstract

The spatial distribution of linear defects in cuboctahedral single crystals of synthetic diamonds, grown under laboratory conditions by the high-pressure high-temperature (HPHT) method near the diamond–graphite equilibrium line, has been studied. Synthetic diamonds of this type have been studied for the first time by the X-ray topo-tomography using a laboratory X-ray source.

Publisher

The Russian Academy of Sciences

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