TESTING SEMICONDUCTOR PRODUCTS USING LOW-FREQUENCY NOISE PARAMETERS-Reference-Cited by-同舟云学术

TESTING SEMICONDUCTOR PRODUCTS USING LOW-FREQUENCY NOISE PARAMETERS

Published:2024-12-15 Issue:6 Volume: Page:39-45
ISSN:0130-3082
Container-title:Дефектоскопия
language:
Short-container-title:Defektoskopiâ

Author:

Gorlov M. I¹,Sergeev V. A²³

Affiliation:

1. Voronezh State Technical University

2. Ulyanovsk Branch, Kotel’nikov Institute of Radio-Engineering and Electronics, Russian Academy of Sciences

3. Ulyanovsk State Technical University

Abstract

This article is a continuation and addition of the article with the same title published in the journal «Defectoscopiya» No. 1 for 2022, which provides six ways to assess the quality and reliability of semiconductor products (SCP) using low-frequency (LF) noise parameters. This article presents a generalization of the results previously obtained by the authors and describes four more methods for diagnosing and evaluating the reliability of SCP by changing the parameters of low-frequency noise under additional external influences such as electrostatic discharge and (or) thermal annealing. It is shown that additional impacts make it possible to increase the reliability of the assessment of the reliability of the SCP.

Publisher

The Russian Academy of Sciences

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