Affiliation:
1. Khakassian State University named after N. F. Katanov
Abstract
Abstract—An attractive direction in the development of nanoelectronics is the development of a new generation of non-volatile storage devices, namely, electric phase memory or PC-RAM (Phase Change Random Access Memory). However, there are a number of unresolved problems here, such as: the stability of the amorphous phase, high power consumption, long information recording time, etc. In order to resolve these contradictions, a new approach was proposed, which consists in the use of Ag–Cu binary alloy nanoparticles as PC-RAM cells. To this end, the molecular dynamics method was used to study the processes of structurization of nanoparticles of this alloy with a size D = 2–10 nm of various target compositions with a variation in the rate of removal of thermal energy. Criteria for the stability of the amorphous and crystalline structure were evaluated, and conclusions were drawn about the target composition and size of nanoparticles suitable for creating phase-change memory cells. It was shown that in the case of the use of nanoparticles of the binary Ag–Cu alloy, it is possible to reduce the size of one cell to 6–8 nm, reduce the time of recording information to 2.5 ns, and, for the first time, based on the eutectic approach, achieve the stability of the amorphous and crystalline structure at different rates of thermal energy removal.
Publisher
The Russian Academy of Sciences
Reference16 articles.
1. Jones R.O. Rationalizing the dominance of Ge/Sb/Te alloys // Physical Review B. 2020. V. 101. P. 024103.
2. Gallo M.L. and Sebastian A. An overview of phase-change memory device physics // J. Phys. D: Appl. Phys. 2020. V. 53. P. 213002 (27 pp.).
3. Лазаренко П.И., Козюхин С.А., Шерченков А.А., Бабич А.В., Тимошенков С.П., Громов Д.Г., Заболотская А.В., Козик В.В. Электрофизические свойства тонких пленок системы Ge–Sb–Te для устройств фазовой памяти // Изв. вузов. Физика. 2016. Т. 59. № 9. С. 80–86.
4. Navarro G., Bourgeois G., Kluge J., Serra A. L., Verdy A., Garrione J., Cyrille M.C., Bernier N., Jannaud A., Sabbione C., Bernard M., Nolot E., Fillot F., Noé P., Fellouh L., Rodriguez G., Beugin V., Cueto O., Castellani N., Coignus, Delaye V., Socquet-Clerc C., Magis T., Boixaderas C.J., Barnola S. and Nowak E. Phase-Change Memory: Performance, Roles and Challenges // 2018 IEEE International Memory Workshop (IMW). May 2018. Kyoto, Japan. cea-02185419
5. Aryana K., Gaskins J.T., Nag J., Stewart D.A., Bai Zh., Mukhopadhyay S., Read J.C., Olson D.H., Hoglund E.R., Howe J.M., Giri A., Grobis M.K. & Hopkins P.E. Interface controlled thermal resistances of ultra-thin chalcogenide-based phase change memory devices // Nature Communications. 2021. V.12. Article number: 774.