Use of Special Devices for X-Ray Interferometric Investigation of Structural Imperfections in Single Crystals

Abstract

A universal device for X-ray interferometric study of structural defects in single crystals has been designed, manufactured and tested. The device can serve both for scratching the surface of the interferometer crystal blocks and for bending it. A technology for generating dislocation in an interferometer block is also proposed. It has been experimentally proved that the moiré topographic patterns obtained using a double X-ray interferometer depend on the orientation of the reflection planes relative to the defect (dislocation). It is shown that multiple interferometers make it possible to simultaneously observe images of various structural imperfections. The results obtained make it possible to judge the spatial orientation of defects and the distribution of strain fields caused by these defects, i.e., strain fields can be visualized as X-ray moiré patterns. The results obtained in the work can form the basis for solving the inverse task, namely, the restoration of mechanical tension fields in the interferometer crystal blocks using the decoding of moiré patterns.