Study of the sensitivity of moisture-sensitive structures with UV reduction on the basis of ZnO produced by the sol-gel method

Abstract

A structure based on a thin-film nanocrystalline zinc oxide obtained by the sol-gel method on a flexible Kapton substrate has been developed. It has been established that its electrical resistance increases significantly under the influence of moisture contained in the air. When irradiated with ultraviolet radiation, the resistance of the structure decreases by almost two orders of magnitude. After the UV exposure finish, a long-term process of restoration of electrical conductivity is observed, which is described by the fractional-exponential Kohlrausch function.