Heavy-Ion Radiation Characteristics of DDR2 Synchronous Dynamic Random Access Memory Fabricated in 56 nm Technology-Reference-Cited by-同舟云学术

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Heavy-Ion Radiation Characteristics of DDR2 Synchronous Dynamic Random Access Memory Fabricated in 56 nm Technology

Published:2012-09-15 Issue:3 Volume:29 Page:315-320
ISSN:2093-5587
Container-title:Journal of Astronomy and Space Sciences
language:en
Short-container-title:Journal of Astronomy and Space Sciences

Author:

Ryu Kwang-Sun,Park Mi-Young,Chae Jang-Soo,Lee In,Uchihori Yukio,Kitamura Hisashi,Takashima Takeshi

Publisher

The Korean Space Science Society

Subject

General Earth and Planetary Sciences,General Physics and Astronomy

Link

http://ocean.kisti.re.kr/downfile/crosscheck/kosss/JAKO201228449924771.pdf

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Use of Commercial FPGA-Based Evaluation Boards for Single-Event Testing of DDR2 and DDR3 SDRAMs;IEEE Transactions on Nuclear Science;2013-12

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