Domain Wall Structure Model of through the Thickness of Fe-Si Sheet Studied by X ray Topography-Reference-Cited by-同舟云学术

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Domain Wall Structure Model of through the Thickness of Fe-Si Sheet Studied by X ray Topography

Published:2024-08-01 Issue:10 Volume:110 Page:788-793
ISSN:0021-1575
Container-title:Tetsu-to-Hagane
language:en
Short-container-title:Tetsu-to-Hagane

Author:

Kataoka Takashi¹,Kawamura Yusuke²,Futagi Toshiro³,Ushigami Yoshiyuki⁴

Affiliation:

1. Setouchi R&D Lab., Technical Research & Development Bureau, Nippon Steel Corporation

2. Steel Research Laboratories, Technical Research & Development Bureau, Nippon Steel Corporation

3. Physical Characterization Solutions Div. R&D Supporting Unit, Nippon Steel Technology Co., Ltd.

4. Nippon Steel Technology Co., Ltd.

Publisher

Iron and Steel Institute of Japan

Link

https://www.jstage.jst.go.jp/article/tetsutohagane/110/10/110_TETSU-2024-032/_pdf

Reference35 articles.

1. 1) W.S.Paxton and T.G.Nilan: J. Appl. Phys., 26(1955), 994. https://doi.org/10.1063/1.1722150

2. 2) C.D.Graham, Jr. and P.W.Neurath: J. Appl. Phys., 28(1957), 888. https://doi.org/10.1063/1.1722881

3. 3) J.W.Shilling and G.L.Houze, Jr.: IEEE Trans. Magn., 10(1974), 195. https://doi.org/10.1109/TMAG.1974.1058317

4. 4) T.Nozawa, T.Yamamoto, Y.Matsuo and Y.Ohya: IEEE Trans. Magn., 14(1978), 252. https://doi.org/10.1109/TMAG.1978.1059767

5. 5) T.Nozawa, T.Yamamoto, Y.Matsuo and Y.Ohya: IEEE Trans. Magn., 15(1979), 972. https://doi.org/10.1109/TMAG.1979.1060287

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