Development of Biaxial Tensile Test System for <i>In-situ</i> Scanning Electron Microscope and Electron Backscatter Diffraction Analysis-Reference-Cited by-同舟云学术

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Development of Biaxial Tensile Test System for In-situ Scanning Electron Microscope and Electron Backscatter Diffraction Analysis

Published:2016 Issue:4 Volume:56 Page:669-677
ISSN:0915-1559
Container-title:ISIJ International
language:en
Short-container-title:ISIJ Int.

Author:

Kubo Masahiro¹,Yoshida Hiroshi²,Uenishi Akihiro¹,Suzuki Seiichi³,Nakazawa Yoshiaki¹,Hama Takayuki⁴,Takuda Hirohiko⁴

Affiliation:

1. Research & Development Bureau, Nippon Steel & Sumitomo Metal Corporation

2. Nagoya Works, Nippon Steel & Sumitomo Metal Corporation

3. TSL Solutions LTD

4. Graduate School of Energy Science, Kyoto University

Publisher

Iron and Steel Institute of Japan

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials

Link

https://www.jstage.jst.go.jp/article/isijinternational/56/4/56_ISIJINT-2015-534/_pdf

Reference45 articles.

1. 1) K. Kishida: Nippon Steel Tech. Rep., 81 (2000), 12.

2. 2) W. J. Lankford, S. C. Snyder and J. A. Bauscher: Trans. A. S. M., 42 (1950), 1197.

3. 3) K. Yoshida: J. Jpn. Soc. Precis. Eng., 25 (1959), 447.

4. 4) R. L. Whiteley: Trans. A. S. M., 52 (1960), 154.

5. 5) R. L. Whiteley, D. E. Wise and D. J. Blickwede: Sheet Metal Ind., 38 (1961), 349.

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